Integrated circuits for space application are tested at accelerators for their susceptibility to Single Event Effects. The high cost and the limited avaliability associated with accelerators testing suggest the development of new low cost techniques. Pulsed laser provides results that can be correlated with ion test results (despite the different physical interaction between semiconductor and ion or laser) and also temporal and spatial information of SEEs. CAD simulators are always used in design and they can be exploited at early stages of the project to accomplish a "smart test" procedure. This new testing methodology overcomes some limitations of laser testing: by coupling a laser equipment with a software simulator and CAD tools, an economic equipment for reliable SEE testing is obtained.
A new methodology for SEE testing and simulation / Pietri, S.; Pavan, Paolo; Iacono, S.; Striccoli, M.. - In: ESA SP. - ISSN 0379-6566. - STAMPA. - 439:(2000), pp. 349-354. (Intervento presentato al convegno European Space Components Conference tenutosi a Nordwijck, The Netherlands nel March 21-23, 2000).
A new methodology for SEE testing and simulation
PAVAN, Paolo;
2000
Abstract
Integrated circuits for space application are tested at accelerators for their susceptibility to Single Event Effects. The high cost and the limited avaliability associated with accelerators testing suggest the development of new low cost techniques. Pulsed laser provides results that can be correlated with ion test results (despite the different physical interaction between semiconductor and ion or laser) and also temporal and spatial information of SEEs. CAD simulators are always used in design and they can be exploited at early stages of the project to accomplish a "smart test" procedure. This new testing methodology overcomes some limitations of laser testing: by coupling a laser equipment with a software simulator and CAD tools, an economic equipment for reliable SEE testing is obtained.Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris