The technique of electron holography is applied to the investigation of microelectric fields such as those associated with reverse-biased p-n junctions. Suitable electron-optical conditions were adopted in order to minimize the effect of the electrostatic fringing field on the reference wave. The electron holograms were optically processed by the method of differential interferometry.
Observations of electrostatic field by electron holography: the case of reverse-biased p-n junctions / Frabboni, Stefano; G. MATTEUCCI AND G., Pozzi. - In: ULTRAMICROSCOPY. - ISSN 0304-3991. - STAMPA. - 23:(1987), pp. 29-37.
Observations of electrostatic field by electron holography: the case of reverse-biased p-n junctions
FRABBONI, Stefano;
1987
Abstract
The technique of electron holography is applied to the investigation of microelectric fields such as those associated with reverse-biased p-n junctions. Suitable electron-optical conditions were adopted in order to minimize the effect of the electrostatic fringing field on the reference wave. The electron holograms were optically processed by the method of differential interferometry.
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