The contrast in HREM images of small spherical coherent precipitates in silicon, having a hypothetical sphalerite structure and an SiX composition, is computed by the multislice method; X represents a dopant (or impurity) atom, ranging from boron up to platinum. The particles are assumed to have a diameter of 2 nm and to exert different amounts of in situ strain ϵ on the silicon matrix. The ideal case of no misfit (ϵ = 0) is also considered. For in situ strains 0 < ϵ < 2%, the maximum contrast, corresponding to the optimum defocus, depends mainly on the atomic number of the element X. For larger strains, which can occur in some cases if the Si[BOND]X bond length in the SiX particle is determined by the covalent radius of the impurity atom X, the strain contrast dominates over the structure factor contrast.

Contrast of small SiX particles in silicon by computed HREM images / Armigliato, A; Bourret, A; Frabboni, Stefano; Parisini, A.. - In: PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH. - ISSN 0031-8965. - STAMPA. - 109:(1988), pp. 53-60.

Contrast of small SiX particles in silicon by computed HREM images

FRABBONI, Stefano;
1988

Abstract

The contrast in HREM images of small spherical coherent precipitates in silicon, having a hypothetical sphalerite structure and an SiX composition, is computed by the multislice method; X represents a dopant (or impurity) atom, ranging from boron up to platinum. The particles are assumed to have a diameter of 2 nm and to exert different amounts of in situ strain ϵ on the silicon matrix. The ideal case of no misfit (ϵ = 0) is also considered. For in situ strains 0 < ϵ < 2%, the maximum contrast, corresponding to the optimum defocus, depends mainly on the atomic number of the element X. For larger strains, which can occur in some cases if the Si[BOND]X bond length in the SiX particle is determined by the covalent radius of the impurity atom X, the strain contrast dominates over the structure factor contrast.
1988
109
53
60
Contrast of small SiX particles in silicon by computed HREM images / Armigliato, A; Bourret, A; Frabboni, Stefano; Parisini, A.. - In: PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH. - ISSN 0031-8965. - STAMPA. - 109:(1988), pp. 53-60.
Armigliato, A; Bourret, A; Frabboni, Stefano; Parisini, A.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/451854
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