Updated results of massive life tests on CMOS are reported. The failure rate derived from laboratory conditions is extrapolated for long life use and compared with field results. Failure mechanism distribution is also reported.
Updating of CMOS reliability / P., Brambilla; Fantini, Fausto; G., Mattana. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 23:(1983), pp. 761-765. [10.1016/0026-2714(83)91162-7]
Updating of CMOS reliability
FANTINI, Fausto;
1983
Abstract
Updated results of massive life tests on CMOS are reported. The failure rate derived from laboratory conditions is extrapolated for long life use and compared with field results. Failure mechanism distribution is also reported.
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