The reliability of transistors, bipolar and CMOS integrated circuits encapsulated in different types of plastic packages was investigated by using the 85°C/85%R.H. test with applied bias and thr results compared with a long term operating life test.

Reliability evaluation of plastic packaged devices for long life applications by THB test / P., Brambilla; C., Canali; Fantini, Fausto; F., Magistrali; G., Mattana. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 26:(1986), pp. 365-384.

Reliability evaluation of plastic packaged devices for long life applications by THB test

FANTINI, Fausto;
1986

Abstract

The reliability of transistors, bipolar and CMOS integrated circuits encapsulated in different types of plastic packages was investigated by using the 85°C/85%R.H. test with applied bias and thr results compared with a long term operating life test.
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Reliability evaluation of plastic packaged devices for long life applications by THB test / P., Brambilla; C., Canali; Fantini, Fausto; F., Magistrali; G., Mattana. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 26:(1986), pp. 365-384.
P., Brambilla; C., Canali; Fantini, Fausto; F., Magistrali; G., Mattana
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11380/451802
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