A new high resolution resistometric measurement technique has been developed in order to perform accurate early resistance change measurements on metal lines submitted to high current densities.

The thermally balanced bridge technique (TBBT): a new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripes / J., VAN OLMEN; W., DE CEUNINCK; L., DE SCHEPPER; A., Goldoni; A., Cervini; Fantini, Fausto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 37:(1997), pp. 1483-1486.

The thermally balanced bridge technique (TBBT): a new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripes

FANTINI, Fausto
1997

Abstract

A new high resolution resistometric measurement technique has been developed in order to perform accurate early resistance change measurements on metal lines submitted to high current densities.
1997
37
1483
1486
The thermally balanced bridge technique (TBBT): a new high resolution resistometric measurement technique for the study of electromigration-induced early resistance changes in metal stripes / J., VAN OLMEN; W., DE CEUNINCK; L., DE SCHEPPER; A., Goldoni; A., Cervini; Fantini, Fausto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 37:(1997), pp. 1483-1486.
J., VAN OLMEN; W., DE CEUNINCK; L., DE SCHEPPER; A., Goldoni; A., Cervini; Fantini, Fausto
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/451769
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