Testing may be more expensive for EPROMs than for other memories, because program and erasure cycles are much longer than read cycles, and therefore the test procedure must not include more than one program and one erasure step. In this paper EPROM operation is modeled by a sequential machine those state and output equations are derived according to boolean matrix algebra.
EPROM testing - part I: theoretical considerations / Alliney, S.; Fantini, Fausto; Morandi, C.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 22:(1982), pp. 965-986.
EPROM testing - part I: theoretical considerations
FANTINI, Fausto;
1982
Abstract
Testing may be more expensive for EPROMs than for other memories, because program and erasure cycles are much longer than read cycles, and therefore the test procedure must not include more than one program and one erasure step. In this paper EPROM operation is modeled by a sequential machine those state and output equations are derived according to boolean matrix algebra.
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