An analysis of the possible failure modes of TTL-LS was carried out, with particular emphasis on long term stability of Schottky diodes, all realized by PtSi-Ti/W-Al metallization system.
Reliability problems in TTL-LS devices / Canali, C.; Fantini, Fausto; Gaviraghi, S.; Senin, A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 21:(1981), pp. 637-651.
Reliability problems in TTL-LS devices
FANTINI, Fausto;
1981
Abstract
An analysis of the possible failure modes of TTL-LS was carried out, with particular emphasis on long term stability of Schottky diodes, all realized by PtSi-Ti/W-Al metallization system.
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