In this paper are compared the reliability data obtained from accelerated life tests with those from massive life test by more than 16,000 devices.
CMOS reliability: a useful case history to revise extrapolation effectiveness, lenght and slope of the learning curve / Brambilla, P.; Fantini, Fausto; Malberti, P.; Mattana, G.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 21:(1981), pp. 181-201.
CMOS reliability: a useful case history to revise extrapolation effectiveness, lenght and slope of the learning curve
FANTINI, Fausto;
1981-01-01
Abstract
In this paper are compared the reliability data obtained from accelerated life tests with those from massive life test by more than 16,000 devices.
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