Metastable deexcitation spectroscopy (MDS) is used to probe the surface electronic properties of semiconductor surfaces and different interfaces with semiconductors. Results are compared to photoemission data and calculations. The following case studies are treated: clean GaAs(110), clean Ge(111)c(2 x 8), Sb/GaAs(110), H:GaAs(110), Yb/GaAs(110), Yb/Si(100) and Ge(111) surface incomplete melting. For each system, MDS spectral features are related to surface valence band (VB) states.

Surface electronic properties by metastable deexcitation spectroscopy / Nannarone, Stefano; Pasquali, Luca. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - STAMPA. - 182:1-4(2001), pp. 227-234. [10.1016/S0168-583X(01)00680-2]

Surface electronic properties by metastable deexcitation spectroscopy

NANNARONE, Stefano;PASQUALI, Luca
2001

Abstract

Metastable deexcitation spectroscopy (MDS) is used to probe the surface electronic properties of semiconductor surfaces and different interfaces with semiconductors. Results are compared to photoemission data and calculations. The following case studies are treated: clean GaAs(110), clean Ge(111)c(2 x 8), Sb/GaAs(110), H:GaAs(110), Yb/GaAs(110), Yb/Si(100) and Ge(111) surface incomplete melting. For each system, MDS spectral features are related to surface valence band (VB) states.
2001
182
1-4
227
234
Surface electronic properties by metastable deexcitation spectroscopy / Nannarone, Stefano; Pasquali, Luca. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - STAMPA. - 182:1-4(2001), pp. 227-234. [10.1016/S0168-583X(01)00680-2]
Nannarone, Stefano; Pasquali, Luca
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/307106
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