The paper describes a reliability prediction methodology that may be used to evaluate the reliability of electronics systems for industrial applications. The proposed methodology takes advantage of the potentiality of different reliability approaches. The aim of this new methodology is to minimize the deficiencies of the traditional reliability prediction methods calculating a corrective factor using the available field return data. In this way is possible to realize more realistic reliability assessment also in the case of new products or products without historic data. Applications of this prediction methodology on real electronic industrial systems are presented.

Reliability predictions in electronic industrial applications / G., Cassanelli; G., Mura; F., Cesaretti; M., Vanzi; Fantini, Fausto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 45:(2005), pp. 1321-1326.

Reliability predictions in electronic industrial applications

FANTINI, Fausto
2005-01-01

Abstract

The paper describes a reliability prediction methodology that may be used to evaluate the reliability of electronics systems for industrial applications. The proposed methodology takes advantage of the potentiality of different reliability approaches. The aim of this new methodology is to minimize the deficiencies of the traditional reliability prediction methods calculating a corrective factor using the available field return data. In this way is possible to realize more realistic reliability assessment also in the case of new products or products without historic data. Applications of this prediction methodology on real electronic industrial systems are presented.
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Reliability predictions in electronic industrial applications / G., Cassanelli; G., Mura; F., Cesaretti; M., Vanzi; Fantini, Fausto. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - STAMPA. - 45:(2005), pp. 1321-1326.
G., Cassanelli; G., Mura; F., Cesaretti; M., Vanzi; Fantini, Fausto
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/303544
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