A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.
Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers / Pelizzo, Mg; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, Stefano. - In: APPLIED OPTICS. - ISSN 1559-128X. - STAMPA. - 45:9(2006), pp. 1985-1992. [10.1364/AO.45.001985]
Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers
NANNARONE, Stefano
2006
Abstract
A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.Pubblicazioni consigliate
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