A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.

Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers / Pelizzo, Mg; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, Stefano. - In: APPLIED OPTICS. - ISSN 1559-128X. - STAMPA. - 45:9(2006), pp. 1985-1992. [10.1364/AO.45.001985]

Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers

NANNARONE, Stefano
2006

Abstract

A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure.
2006
45
9
1985
1992
Polarization and higher-order content measurement of a soft-x-ray monochromatized beam with Mo-Si multilayers / Pelizzo, Mg; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, Stefano. - In: APPLIED OPTICS. - ISSN 1559-128X. - STAMPA. - 45:9(2006), pp. 1985-1992. [10.1364/AO.45.001985]
Pelizzo, Mg; Frassetto, F; Nicolosi, P; Giglia, A; Mahne, N; Nannarone, Stefano
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/2860
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