The "photo-gain effect" amplifying the DC photocurrent of kappa-Ga2O3 UV-C photoresistors is analyzed by means of 2D numerical simulations and linked to the capture of photogenerated holes by deep donor levels, probably associated with oxygen vacancies. The resulting ionization of the deep donors leads to an increase in the electron density, hence to enhanced conductivity under illumination.

Photo-Gain Effect in κ-Ga2O3 UV-C Photoresistors Induced by Trapping of Photogenerated Holes / Asteriti, A.; Verzellesi, G.; Sozzi, G.; Baraldi, A.; Mazzolini, P.; Moumen, A.; Parisini, A.; Pavesi, M.; Bosi, M.; Mosca, R.; Seravalli, L.; Fornari, R.. - In: PHYSICA STATUS SOLIDI B-BASIC RESEARCH. - ISSN 0370-1972. - (2025), pp. 1-6. [10.1002/pssb.202400581]

Photo-Gain Effect in κ-Ga2O3 UV-C Photoresistors Induced by Trapping of Photogenerated Holes

Asteriti A.;Verzellesi G.
;
2025

Abstract

The "photo-gain effect" amplifying the DC photocurrent of kappa-Ga2O3 UV-C photoresistors is analyzed by means of 2D numerical simulations and linked to the capture of photogenerated holes by deep donor levels, probably associated with oxygen vacancies. The resulting ionization of the deep donors leads to an increase in the electron density, hence to enhanced conductivity under illumination.
2025
Inglese
2400581
1
6
deep traps; gallium oxide; photodetectors; photo-gain
open
info:eu-repo/semantics/article
Contributo su RIVISTA::Articolo su rivista
262
Photo-Gain Effect in κ-Ga2O3 UV-C Photoresistors Induced by Trapping of Photogenerated Holes / Asteriti, A.; Verzellesi, G.; Sozzi, G.; Baraldi, A.; Mazzolini, P.; Moumen, A.; Parisini, A.; Pavesi, M.; Bosi, M.; Mosca, R.; Seravalli, L.; Fornari, R.. - In: PHYSICA STATUS SOLIDI B-BASIC RESEARCH. - ISSN 0370-1972. - (2025), pp. 1-6. [10.1002/pssb.202400581]
Asteriti, A.; Verzellesi, G.; Sozzi, G.; Baraldi, A.; Mazzolini, P.; Moumen, A.; Parisini, A.; Pavesi, M.; Bosi, M.; Mosca, R.; Seravalli, L.; Fornari...espandi
12
   UV-C sensors based on gallium oxide
   USE GAO
   NextGenerationEU
   PRIN 2022, N. 2022A4AN2F
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1374768
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