Entanglement and correlation are at the basis of quantum mechanics and have been used in optics to create a framework for “ghost imaging”. We propose that a similar scheme can be used in an electron microscope to exploit the correlation of electrons with the coincident detection of collective mode excitations in a sample. In this way, an image of the sample can be formed on an electron camera even if electrons never illuminated the region of interest directly. This concept, which can be regarded as the inverse of photon-induced near-field electron microscopy, can be used to probe delicate molecules with a resolution that is beyond the wavelength of the collective mode.

One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons / Rotunno, E.; Gargiulo, S.; Vanacore, G. M.; Mechel, C.; Tavabi, A. H.; Dunin-Borkowski, R. E.; Carbone, F.; Madan, I.; Frabboni, S.; Guner, T.; Karimi, E.; Kaminer, I.; Grillo, V.. - In: ACS PHOTONICS. - ISSN 2330-4022. - 10:6(2023), pp. 1708-1715. [10.1021/acsphotonics.2c01925]

One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons

Frabboni S.
Membro del Collaboration Group
;
Grillo V.
2023

Abstract

Entanglement and correlation are at the basis of quantum mechanics and have been used in optics to create a framework for “ghost imaging”. We propose that a similar scheme can be used in an electron microscope to exploit the correlation of electrons with the coincident detection of collective mode excitations in a sample. In this way, an image of the sample can be formed on an electron camera even if electrons never illuminated the region of interest directly. This concept, which can be regarded as the inverse of photon-induced near-field electron microscopy, can be used to probe delicate molecules with a resolution that is beyond the wavelength of the collective mode.
2023
10
6
1708
1715
One-Dimensional “Ghost Imaging” in Electron Microscopy of Inelastically Scattered Electrons / Rotunno, E.; Gargiulo, S.; Vanacore, G. M.; Mechel, C.; Tavabi, A. H.; Dunin-Borkowski, R. E.; Carbone, F.; Madan, I.; Frabboni, S.; Guner, T.; Karimi, E.; Kaminer, I.; Grillo, V.. - In: ACS PHOTONICS. - ISSN 2330-4022. - 10:6(2023), pp. 1708-1715. [10.1021/acsphotonics.2c01925]
Rotunno, E.; Gargiulo, S.; Vanacore, G. M.; Mechel, C.; Tavabi, A. H.; Dunin-Borkowski, R. E.; Carbone, F.; Madan, I.; Frabboni, S.; Guner, T.; Karimi...espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1334749
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