We investigate the impact of charge-trapping on ferroelectric (FE) switching and its influence on memory window (MW) and retention of FeFET. Fabricated FinFETs with ferroelectric gate stack were used to study defects properties (within HZO), trapping/FE-switching interplay, and dynamics. Starting from the electronic-assisted nucleation of FE domains, we investigated the interface charging and degradation, as well as their impact on the polarization compensation, MW and stabilization of the retention. Finally, a balance between those competing processes was analyzed and a retention model of FeFET (capturing behavior over device's lifetime) was developed.

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation / Pesic, M.; Beltrando, B.; Padovani, A.; Miyashita, T.; Kim, N. -S.; Larcher, L.. - 2022-:(2022), pp. 4A11-4A18. (Intervento presentato al convegno 2022 IEEE International Reliability Physics Symposium, IRPS 2022 tenutosi a Dallas, TX, USA nel 2022) [10.1109/IRPS48227.2022.9764520].

Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation

Padovani A.;Larcher L.
2022

Abstract

We investigate the impact of charge-trapping on ferroelectric (FE) switching and its influence on memory window (MW) and retention of FeFET. Fabricated FinFETs with ferroelectric gate stack were used to study defects properties (within HZO), trapping/FE-switching interplay, and dynamics. Starting from the electronic-assisted nucleation of FE domains, we investigated the interface charging and degradation, as well as their impact on the polarization compensation, MW and stabilization of the retention. Finally, a balance between those competing processes was analyzed and a retention model of FeFET (capturing behavior over device's lifetime) was developed.
2022
2022 IEEE International Reliability Physics Symposium, IRPS 2022
Dallas, TX, USA
2022
2022-
4A11
4A18
Pesic, M.; Beltrando, B.; Padovani, A.; Miyashita, T.; Kim, N. -S.; Larcher, L.
Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation / Pesic, M.; Beltrando, B.; Padovani, A.; Miyashita, T.; Kim, N. -S.; Larcher, L.. - 2022-:(2022), pp. 4A11-4A18. (Intervento presentato al convegno 2022 IEEE International Reliability Physics Symposium, IRPS 2022 tenutosi a Dallas, TX, USA nel 2022) [10.1109/IRPS48227.2022.9764520].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1280620
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