A multiscale simulation platform predicts the effect of atomic level defects in thin films on the electrical characteristics of nanoscale devices and identifies ways to engineer these defects to achieve optimum performance and reliability in logic and memory circuits.
Engineering Atom Scale Defects in Materials for Future Electronic Devices / Pramanik, D.; Nardi, F.; Padovani, A.. - (2020), pp. 1-4. (Intervento presentato al convegno 4th Electron Devices Technology and Manufacturing Conference, EDTM 2020 tenutosi a mys nel 2020) [10.1109/EDTM47692.2020.9117812].
Engineering Atom Scale Defects in Materials for Future Electronic Devices
Padovani A.
2020
Abstract
A multiscale simulation platform predicts the effect of atomic level defects in thin films on the electrical characteristics of nanoscale devices and identifies ways to engineer these defects to achieve optimum performance and reliability in logic and memory circuits.
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(D. Pramanik - EDTM 2020) Engineering Atom Scale Defects in Materials for Future Electronic Devices.pdf
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