In this paper, we investigate electron transport and electron scattering in the insulators of the Graphene Base Transistor (GBT) by means of a Monte Carlo transport model. We focus on electron backscattering in the base-collector insulator as the possible root cause of the large experimental base current and small measured common-base current gain (αF) of GBTs. Different GBT structures have been simulated and the impact of the scattering parameters on the base current is analyzed. Simulated backscattering-limited αF values are found to be much higher than available experimental data, suggesting that state-of-the-art technology is still far from being optimized. However, those simulated αF values can be low enough to limit the maximum achievable GBT performance.
Backscattering and common-base current gain of the Graphene Base Transistor (GBT) / Venica, Stefano; Driussi, Francesco; Palestri, Pierpaolo; Selmi, Luca. - In: MICROELECTRONIC ENGINEERING. - ISSN 0167-9317. - ELETTRONICO. - 147:(2015), pp. 192-195. [10.1016/j.mee.2015.04.089]
Backscattering and common-base current gain of the Graphene Base Transistor (GBT)
PALESTRI, Pierpaolo;SELMI, Luca
2015
Abstract
In this paper, we investigate electron transport and electron scattering in the insulators of the Graphene Base Transistor (GBT) by means of a Monte Carlo transport model. We focus on electron backscattering in the base-collector insulator as the possible root cause of the large experimental base current and small measured common-base current gain (αF) of GBTs. Different GBT structures have been simulated and the impact of the scattering parameters on the base current is analyzed. Simulated backscattering-limited αF values are found to be much higher than available experimental data, suggesting that state-of-the-art technology is still far from being optimized. However, those simulated αF values can be low enough to limit the maximum achievable GBT performance.Pubblicazioni consigliate
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