Long-channel effective mobilities as well as transfer characteristics of a 32 nm single-gate SOI and a 16 nm double-gate (DG) MOSFET have been simulated with live different Monte Carlo (MC) device simulators. The differences are mostly rather small for the SOI-FET with quantum effects having a minor effect on threshold voltage due to the lowly doped channel, while the two multi-subband MC simulators show some prominent deviations in the case of the DG-FET. High-K mobility degradation by remote phonon scattering (RPS) in free carrier MC approximation leads to smaller performance degradation compared to multi-subband MC with remote Coulomb scattering (RCS) and RPS, but requires further investigations.

Comparison of Semiclassical Transport Formulations Including Quantum Corrections for Advanced Devices with High-K Gate Stacks / Bufler, F. M.; Aubry Fortuna, V; Bournel, A; Braccioli, M; Dollfus, P; Esseni, David; Fiegna, C; Gamizk, F; De Michielis, Marco; Palestri, Pierpaolo; Saint Martin, J; Sampedrok, C; Sangiorgi, E; Selmi, Luca; Toniutti, Paolo. - STAMPA. - (2010), pp. 319-322. ( 2010 14th International Workshop on Computational Electronics, IWCE 2010 Pisa, ita Ottobre) [10.1109/IWCE.2010.5677952].

Comparison of Semiclassical Transport Formulations Including Quantum Corrections for Advanced Devices with High-K Gate Stacks

PALESTRI, Pierpaolo;SELMI, Luca;
2010

Abstract

Long-channel effective mobilities as well as transfer characteristics of a 32 nm single-gate SOI and a 16 nm double-gate (DG) MOSFET have been simulated with live different Monte Carlo (MC) device simulators. The differences are mostly rather small for the SOI-FET with quantum effects having a minor effect on threshold voltage due to the lowly doped channel, while the two multi-subband MC simulators show some prominent deviations in the case of the DG-FET. High-K mobility degradation by remote phonon scattering (RPS) in free carrier MC approximation leads to smaller performance degradation compared to multi-subband MC with remote Coulomb scattering (RCS) and RPS, but requires further investigations.
2010
2010 14th International Workshop on Computational Electronics, IWCE 2010
Pisa, ita
Ottobre
319
322
Bufler, F. M.; Aubry Fortuna, V; Bournel, A; Braccioli, M; Dollfus, P; Esseni, David; Fiegna, C; Gamizk, F; De Michielis, Marco; Palestri, Pierpaolo; ...espandi
Comparison of Semiclassical Transport Formulations Including Quantum Corrections for Advanced Devices with High-K Gate Stacks / Bufler, F. M.; Aubry Fortuna, V; Bournel, A; Braccioli, M; Dollfus, P; Esseni, David; Fiegna, C; Gamizk, F; De Michielis, Marco; Palestri, Pierpaolo; Saint Martin, J; Sampedrok, C; Sangiorgi, E; Selmi, Luca; Toniutti, Paolo. - STAMPA. - (2010), pp. 319-322. ( 2010 14th International Workshop on Computational Electronics, IWCE 2010 Pisa, ita Ottobre) [10.1109/IWCE.2010.5677952].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1163069
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