In this work, the effect of digital CMOS technology down scaling on the performances of MOS Current Mode Logic frequency dividers is addressed. A fast and effective methodology to design the dividers is presented. The insight given by the methodology is then exploited to study the down scaling of MCML dividers by considering two CMOS technologies representative of the 130nm and 90nm technology nodes. The model provides quantitatively accurate predictions of the advantages of scaling on current consumption and maximum frequency of operation.

A Model to Understand Current Consumption, Maximum Operating Frequency And Scaling Trends Of MCML Frequency Dividers / Nonis, Roberto; Palumbo, Enzo; Palestri, Pierpaolo; Selmi, Luca. - (2006), pp. 329-332. ((Intervento presentato al convegno PhD Research in Microelectronics (PRIME) tenutosi a Otranto, Italy nel 12-15 Giugno 2006 [10.1109/RME.2006.1689963].

A Model to Understand Current Consumption, Maximum Operating Frequency And Scaling Trends Of MCML Frequency Dividers

SELMI, Luca
2006

Abstract

In this work, the effect of digital CMOS technology down scaling on the performances of MOS Current Mode Logic frequency dividers is addressed. A fast and effective methodology to design the dividers is presented. The insight given by the methodology is then exploited to study the down scaling of MCML dividers by considering two CMOS technologies representative of the 130nm and 90nm technology nodes. The model provides quantitatively accurate predictions of the advantages of scaling on current consumption and maximum frequency of operation.
PhD Research in Microelectronics (PRIME)
Otranto, Italy
12-15 Giugno 2006
329
332
Nonis, Roberto; Palumbo, Enzo; Palestri, Pierpaolo; Selmi, Luca
A Model to Understand Current Consumption, Maximum Operating Frequency And Scaling Trends Of MCML Frequency Dividers / Nonis, Roberto; Palumbo, Enzo; Palestri, Pierpaolo; Selmi, Luca. - (2006), pp. 329-332. ((Intervento presentato al convegno PhD Research in Microelectronics (PRIME) tenutosi a Otranto, Italy nel 12-15 Giugno 2006 [10.1109/RME.2006.1689963].
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11380/1163027
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