This paper presents a detailed analysis of CMOS latchup dependencies on layout and geometrical dimensions. To this purpose test structures have been fabricated featuring butted contacts and guard rings with different values of critical distances. The devices have been experimentally characterized in the triggering and sustaining regime, and numerical simulations have been extensively used to interpret the experimental data. It is shown that great care should be taken in designing protection structures since larger areas do not always lead to enhanced latchup immunity.

This paper presents a detailed analysis of CMOS latchup dependencies on layout and geometrical dimensions. To this purpose test structures have been fabricated featuring butted contacts and guard rings with different values of critical distances. The devices have been experimentally characterized in the triggering and sustaining regime, and numerical simulations have been extensively used to interpret the experimental data. It is shown that great care should be taken in designing protection structures since larger areas do not always lead to enhanced latchup immunity. © 1988 IEEE

Layout Dependence of CMOS Latchup / Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Cavioni, T; Ricco, B.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 35:11(1988), pp. 1892-1901. [10.1109/16.7402]

Layout Dependence of CMOS Latchup

SELMI, Luca;
1988

Abstract

This paper presents a detailed analysis of CMOS latchup dependencies on layout and geometrical dimensions. To this purpose test structures have been fabricated featuring butted contacts and guard rings with different values of critical distances. The devices have been experimentally characterized in the triggering and sustaining regime, and numerical simulations have been extensively used to interpret the experimental data. It is shown that great care should be taken in designing protection structures since larger areas do not always lead to enhanced latchup immunity. © 1988 IEEE
1988
35
11
1892
1901
Layout Dependence of CMOS Latchup / Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Cavioni, T; Ricco, B.. - In: IEEE TRANSACTIONS ON ELECTRON DEVICES. - ISSN 0018-9383. - 35:11(1988), pp. 1892-1901. [10.1109/16.7402]
Menozzi, R; Selmi, Luca; Sangiorgi, Enrico; Crisenza, G; Cavioni, T; Ricco, B.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1162970
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