The morphology of circular DNA deposited from a solution on the mica surface is analyzed from the power spectrum density (PSD) of the atomic force microscopy (AFM) images. Sample morphology is modulated in a broad range of concentration C from isolated molecules to highly entangled networks. DNA exhibits a multiaffine behavior with two correlation length scales: the persistence length P which remains constant (approximate to 50 nm) within the C range and the intermolecular distance which exhibits a decay with increasing C. Applying a diffusion based model in which xi scales as xi approximate to D(-0.25)center dot C(-0.5), we extracted the DNA diffusion coefficient D approximate to 2 x 10(-7) cm(2)/S. This value is consistent with a high-molecular-weight plasmid DNA supercoiled in the solution.

Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces / A., Calò; P., Stoliar; E., Bystrenova; F., Valle; Biscarini, Fabio. - In: JOURNAL OF PHYSICAL CHEMISTRY. B, CONDENSED MATTER, MATERIALS, SURFACES, INTERFACES & BIOPHYSICAL. - ISSN 1520-6106. - ELETTRONICO. - 113:(2009), pp. 4987-4990. [10.1021/jp8097318]

Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces

BISCARINI, FABIO
2009

Abstract

The morphology of circular DNA deposited from a solution on the mica surface is analyzed from the power spectrum density (PSD) of the atomic force microscopy (AFM) images. Sample morphology is modulated in a broad range of concentration C from isolated molecules to highly entangled networks. DNA exhibits a multiaffine behavior with two correlation length scales: the persistence length P which remains constant (approximate to 50 nm) within the C range and the intermolecular distance which exhibits a decay with increasing C. Applying a diffusion based model in which xi scales as xi approximate to D(-0.25)center dot C(-0.5), we extracted the DNA diffusion coefficient D approximate to 2 x 10(-7) cm(2)/S. This value is consistent with a high-molecular-weight plasmid DNA supercoiled in the solution.
2009
113
4987
4990
Measurement of DNA Morphological Parameters at Highly Entangled Regime on Surfaces / A., Calò; P., Stoliar; E., Bystrenova; F., Valle; Biscarini, Fabio. - In: JOURNAL OF PHYSICAL CHEMISTRY. B, CONDENSED MATTER, MATERIALS, SURFACES, INTERFACES & BIOPHYSICAL. - ISSN 1520-6106. - ELETTRONICO. - 113:(2009), pp. 4987-4990. [10.1021/jp8097318]
A., Calò; P., Stoliar; E., Bystrenova; F., Valle; Biscarini, Fabio
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/966502
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