We have used confocal micro Raman spectroscopy, atomic force microscopy (AFM), and x-ray diffraction (XRD) to investigate pentacene films obtained by vacuum deposition on SiO2 substrates. These methods allow us to follow the evolution of lattice structure, vibrational dynamics, and crystal morphology during the growth from monolayer, to TF, and, finally, to bulk crystal. The Raman measurements, supported by the AFM and XRD data, indicate that the film morphology depends on the deposition rate. High deposition rates yield two-dimensional nucleation and quasi-layer-by-layer growth of the T-F form only. Low rates yield three-dimensional nucleation and growth, with phase mixing occurring in sufficiently thick films, where the T-F form is accompanied by the "high-temperature" bulk phase. Our general findings are consistent with those of previous work. However, the Raman measurements, supported by lattice dynamics calculations, provide additional insight into the nature of the TFs, showing that their characteristic spectra originate from a loss of dynamical correlation between adjacent layers.

Structure and dynamics of pentacene on SiO2: From monolayer to bulk structure / A., Brillante; I., Bilotti; R. G., Della Valle; E., Venuti; A., Girlando; M., Masino; F., Liscio; S., Milita; C., Albonetti; P., D'Angelo; A., Shehu; Biscarini, Fabio. - In: PHYSICAL REVIEW. X. - ISSN 2160-3308. - 85:19(2012), pp. 195308-195308. [10.1103/PhysRevB.85.195308]

Structure and dynamics of pentacene on SiO2: From monolayer to bulk structure

BISCARINI, FABIO
2012

Abstract

We have used confocal micro Raman spectroscopy, atomic force microscopy (AFM), and x-ray diffraction (XRD) to investigate pentacene films obtained by vacuum deposition on SiO2 substrates. These methods allow us to follow the evolution of lattice structure, vibrational dynamics, and crystal morphology during the growth from monolayer, to TF, and, finally, to bulk crystal. The Raman measurements, supported by the AFM and XRD data, indicate that the film morphology depends on the deposition rate. High deposition rates yield two-dimensional nucleation and quasi-layer-by-layer growth of the T-F form only. Low rates yield three-dimensional nucleation and growth, with phase mixing occurring in sufficiently thick films, where the T-F form is accompanied by the "high-temperature" bulk phase. Our general findings are consistent with those of previous work. However, the Raman measurements, supported by lattice dynamics calculations, provide additional insight into the nature of the TFs, showing that their characteristic spectra originate from a loss of dynamical correlation between adjacent layers.
2012
85
19
195308
195308
Structure and dynamics of pentacene on SiO2: From monolayer to bulk structure / A., Brillante; I., Bilotti; R. G., Della Valle; E., Venuti; A., Girlando; M., Masino; F., Liscio; S., Milita; C., Albonetti; P., D'Angelo; A., Shehu; Biscarini, Fabio. - In: PHYSICAL REVIEW. X. - ISSN 2160-3308. - 85:19(2012), pp. 195308-195308. [10.1103/PhysRevB.85.195308]
A., Brillante; I., Bilotti; R. G., Della Valle; E., Venuti; A., Girlando; M., Masino; F., Liscio; S., Milita; C., Albonetti; P., D'Angelo; A., Shehu; ...espandi
File in questo prodotto:
File Dimensione Formato  
PhysRevB.85.195308.pdf

Open access

Tipologia: Versione pubblicata dall'editore
Dimensione 1.05 MB
Formato Adobe PDF
1.05 MB Adobe PDF Visualizza/Apri
Pubblicazioni consigliate

Licenza Creative Commons
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/963117
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 40
  • ???jsp.display-item.citation.isi??? 40
social impact