We present a density functional investigation of the surface effects on the catechol sensitization of selected hexagonal semiconductors (SiC, GaN, InN, CdS, CdSe). The atomic relaxation, the ionicity, and the reactivity, which characterize the selected substrates, are found to crucially influence both the bonding geometry and the electronic level alignment at the interface. Our results indicate that surface effects must be considered in order to obtain a correct picture of the optoelectronic response of the system. Our findings pave the way to the fundamental understanding and future design of hybrid catecholate materials for optoelectronic and biomedical applications.
Surface Effects on Catechol/Semiconductor Interfaces / A., Calzolari; Ruini, Alice; A., Catellani. - In: JOURNAL OF PHYSICAL CHEMISTRY. C. - ISSN 1932-7447. - ELETTRONICO. - 116:32(2012), pp. 17158-17163. [10.1021/jp307117h]
Surface Effects on Catechol/Semiconductor Interfaces
RUINI, Alice;
2012
Abstract
We present a density functional investigation of the surface effects on the catechol sensitization of selected hexagonal semiconductors (SiC, GaN, InN, CdS, CdSe). The atomic relaxation, the ionicity, and the reactivity, which characterize the selected substrates, are found to crucially influence both the bonding geometry and the electronic level alignment at the interface. Our results indicate that surface effects must be considered in order to obtain a correct picture of the optoelectronic response of the system. Our findings pave the way to the fundamental understanding and future design of hybrid catecholate materials for optoelectronic and biomedical applications.File | Dimensione | Formato | |
---|---|---|---|
calz+12jpcc.pdf
Accesso riservato
Tipologia:
Versione dell'autore revisionata e accettata per la pubblicazione
Dimensione
318.48 kB
Formato
Adobe PDF
|
318.48 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris