We investigated the degree of forward focusing and of multiple-scattering-induced defocusing for electrons in the keV range along regular chains of different atomic density in GaAs and GaP single crystals. The intensity angular anisotropy of elastic and inelastic (losses) Auger electrons was measured in the primary-beam diffraction-modulated electron-emission approach. In variance to the photoelectron-diffraction (PD) case, the possible influence of the energy-loss mechanism on the observed anisotropy can be disregarded and the in-depth distribution of the scattered intensity is independently determined. Both the focusing and defocusing lengths were found to be significantly larger than in previously reported PD results, and strongly dependent on the interatomic spacing. A comparative study of defocusing along the Ga [110] chains in GaAs and GaP gives experimental evidence of the influence of nearest-neighbor atomic rows (As and P, respectively) on the scattering processes.

Focusing and defocusing in electron scattering along atomic chains / VALERI, Sergio; A., di Bona; G. C., Gazzadi. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - STAMPA. - 50(1994), pp. 14617-14620.

I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Powered by IRIS-about IRIS-Utilizzo dei cookie

 Copyright © 2022