Measurements have been made of the current noise in thick-film resistors (TFR) based on Ru-pyrochlore conductive grains, with sheet resistivities covering a range of four decades. The temperature dependence of the exponent (alfa) in 1/f noise spectra and the relative integral noise was investigated in the temperature range from 77 to 650 K. It shown that the presence of a minimum in the realtive voltage noise fluctuations os a general phenomenon, as is the increase in (alfa) with increasing temperature. Tevetheless these two effects seem not be mutually correlated. The possibility of developing interpretative model for noise phenomenon in TFR is discussed.
Excess noise and its temperature dependence in thick-film (cermet) resistors / A., Masoero; A. M., Rietto; Morten, Bruno; M., Prudenziati. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 16:(1983), pp. 669-674.
Excess noise and its temperature dependence in thick-film (cermet) resistors
MORTEN, Bruno;
1983
Abstract
Measurements have been made of the current noise in thick-film resistors (TFR) based on Ru-pyrochlore conductive grains, with sheet resistivities covering a range of four decades. The temperature dependence of the exponent (alfa) in 1/f noise spectra and the relative integral noise was investigated in the temperature range from 77 to 650 K. It shown that the presence of a minimum in the realtive voltage noise fluctuations os a general phenomenon, as is the increase in (alfa) with increasing temperature. Tevetheless these two effects seem not be mutually correlated. The possibility of developing interpretative model for noise phenomenon in TFR is discussed.
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