The strain coefficient of resistivity of resistors deposited on a substrate is analysed, and an expression for its correlation to the measurable longitudinal and transverse gauge factors is given for isotropic (metal, amorphous semiconductor and cermet) resistors. The use of this expression for the evaluation of other physical quantities is exemplified by the calculation of the temperature coefficients of resistivity for resistors on substrates of different thermal expansivity.
Strain sensitivity in film and cermet resistors: measured and physical quantities / Morten, Bruno; M., Prudenziati; A., Taroni. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 12:(1979), pp. L51-L54. [10.1088/0022-3727/12/5003]
Strain sensitivity in film and cermet resistors: measured and physical quantities
MORTEN, Bruno;
1979
Abstract
The strain coefficient of resistivity of resistors deposited on a substrate is analysed, and an expression for its correlation to the measurable longitudinal and transverse gauge factors is given for isotropic (metal, amorphous semiconductor and cermet) resistors. The use of this expression for the evaluation of other physical quantities is exemplified by the calculation of the temperature coefficients of resistivity for resistors on substrates of different thermal expansivity.
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