The aim of this study is the textural characterization of very low togreenschist facies metamorphic rocks by means of a conventional X-ray source, possibly establishing a relationship between the extent of morphological orientation of mineral grains and metamorphic degree.For a long time geologists investigated the morphological orientation of mineral grains in polycrystalline rocks by means of petrographic microscope equipped with a Universal stage. More recently diffraction of conventional X-ray sources as well as diffraction (or transmission) of hard X-rays, electrons and neutrons has been applied to these kind of study.However, whereas X-ray conventional sources can be regarded as a routine technology, hard X-ray, electron and neutron sources are only available in a few facilities around the world.Phyllosilicates such as smectite, illite, muscovite, chlorite and biotite play a key role in the textural characteristics of the mineral assemblages of rocks characterized by increasing metamorphic degree. The present study is focused on the variation of the X-ray intensities of selected reflections of these phases. In short, if a morphologic orientation of the grains of a certain phyllosilicate is present, a variation of the intensity of these reflections will be measured when the rock sample is rotated in a goniometer keeping constant both the incident beam angle and the position of the detector.The samples selected for the study are the following: 1) a Ms, Chl, Qtz, Pl fine grained metapelite from Frassenetto (UD, Italy) (very low grade metamorphism, Anchizone) with some detrital muscovite flakes recognizable by their coarser grain size; 2) Ms, Chl, Qtz, Pl fine grained metapelite from Chiadenis (UD, Italy) (low grade metamorphism, Epizone) with some detrital muscovite flakes recognizable by their coarser grain size; 3) a Ms, Chl, Ilm, Qtz, Pl layered phyllite from Villabassa (BZ, Italy) (Greenschist facies metamorphism, Ms-Chl-Bt), with crenulated main foliation and axial planes defining a second spaced foliation; 4) a Ms, Bt, Grt, Ilm, Qtz, Pl layered phyllite from Luson (BZ, Italy) (Greenschist facies metamorphism, Ms-Bt-Grt), with crenulated main foliation and axial planes defining a second spaced foliation.

Textural study of metamorphic rocks by means of a conventional X-ray source / Malferrari, Daniele; Brigatti, Maria Franca; Laurora, Angela; R., Sassi; F. P., Sassi. - In: EPITOME. - ISSN 1972-1552. - STAMPA. - 4:(2011), pp. 221-221. (Intervento presentato al convegno Geoitalia 2011 tenutosi a Torino nel 19-23 settembre 2011).

Textural study of metamorphic rocks by means of a conventional X-ray source

MALFERRARI, Daniele;BRIGATTI, Maria Franca;LAURORA, Angela;
2011

Abstract

The aim of this study is the textural characterization of very low togreenschist facies metamorphic rocks by means of a conventional X-ray source, possibly establishing a relationship between the extent of morphological orientation of mineral grains and metamorphic degree.For a long time geologists investigated the morphological orientation of mineral grains in polycrystalline rocks by means of petrographic microscope equipped with a Universal stage. More recently diffraction of conventional X-ray sources as well as diffraction (or transmission) of hard X-rays, electrons and neutrons has been applied to these kind of study.However, whereas X-ray conventional sources can be regarded as a routine technology, hard X-ray, electron and neutron sources are only available in a few facilities around the world.Phyllosilicates such as smectite, illite, muscovite, chlorite and biotite play a key role in the textural characteristics of the mineral assemblages of rocks characterized by increasing metamorphic degree. The present study is focused on the variation of the X-ray intensities of selected reflections of these phases. In short, if a morphologic orientation of the grains of a certain phyllosilicate is present, a variation of the intensity of these reflections will be measured when the rock sample is rotated in a goniometer keeping constant both the incident beam angle and the position of the detector.The samples selected for the study are the following: 1) a Ms, Chl, Qtz, Pl fine grained metapelite from Frassenetto (UD, Italy) (very low grade metamorphism, Anchizone) with some detrital muscovite flakes recognizable by their coarser grain size; 2) Ms, Chl, Qtz, Pl fine grained metapelite from Chiadenis (UD, Italy) (low grade metamorphism, Epizone) with some detrital muscovite flakes recognizable by their coarser grain size; 3) a Ms, Chl, Ilm, Qtz, Pl layered phyllite from Villabassa (BZ, Italy) (Greenschist facies metamorphism, Ms-Chl-Bt), with crenulated main foliation and axial planes defining a second spaced foliation; 4) a Ms, Bt, Grt, Ilm, Qtz, Pl layered phyllite from Luson (BZ, Italy) (Greenschist facies metamorphism, Ms-Bt-Grt), with crenulated main foliation and axial planes defining a second spaced foliation.
2011
4
221
221
Malferrari, Daniele; Brigatti, Maria Franca; Laurora, Angela; R., Sassi; F. P., Sassi
Textural study of metamorphic rocks by means of a conventional X-ray source / Malferrari, Daniele; Brigatti, Maria Franca; Laurora, Angela; R., Sassi; F. P., Sassi. - In: EPITOME. - ISSN 1972-1552. - STAMPA. - 4:(2011), pp. 221-221. (Intervento presentato al convegno Geoitalia 2011 tenutosi a Torino nel 19-23 settembre 2011).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/739075
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