We report the results of a Surface X-Ray Diffraction (SXRD) study of Fe nanostructured films depositedon c(2×2)-N/Cu(100) at room temperature (RT), with Fe coverage ΘFe=0.5ML and ΘFe=1 ML. Thec(2×2)-N/Cu(100) surface is an example of self-organised system, that can be used for growth of arraysof metal nano-islands and organic molecules assemblies. We chose two different values of N coverage,ΘN=0.3 ML and ΘN=0.5 ML, the second value corresponding to N saturation. We monitored the presenceof surface diffraction peaks in hk scans and we performed Crystal Truncation Rods (CTR) analysiswith ROD fitting programme. In the case of ΘN=0.5 ML, i.e. at saturation coverage, the CTR could be fittedwith one surface domain with p4gm(2×2) symmetry. In the surface cell adopted, N atoms occupy fourfoldhollow sites, with Fe (intermixed with Cu) giving rise to a “clock” reconstruction previously observedon iron nitride films obtained by co-deposition and annealing. This result is an indirect confirmation of Nsurface segregation on top of the Fe films, occurring during the growth at RT. When subsaturation N coverage(ΘN=0.3 ML) is used as a substrate for Fe deposition, the best results could be obtained with amodel where two surface domains are present: the first one corresponds to a surface cell with Fe sittingin four-fold hollow sites on bare Cu areas, with possible interdiffusion in the second lattice. The seconddomain is assigned to growth of Fe on the N-covered square islands occurring once the bare Cu areasare fully covered. The SXRD analysis on N-covered surface domains shows that the mechanism of reconstructionand of N segregation on top layer is already active at RT for all N-coverage values.
|Data di pubblicazione:||2012|
|Titolo:||Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2×2)-N/Cu(100)|
|Autore/i:||S. D'Addato; F. Borgatti; R. Felici; P.Finetti|
|Digital Object Identifier (DOI):||10.1016/j.susc.2012.01.015|
|Codice identificativo ISI:||WOS:000302522500008|
|Codice identificativo Scopus:||2-s2.0-84858337125|
|Citazione:||Surface X-ray diffraction analysis of Fe nanostructured films grown on c(2×2)-N/Cu(100) / S. D'Addato; F. Borgatti; R. Felici; P.Finetti. - In: SURFACE SCIENCE. - ISSN 0039-6028. - STAMPA. - 606(2012), pp. 813-819.|
|Tipologia||Articolo su rivista|
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