This Special Issue of the IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY is intended to give a com- prehensive picture of the state-of-the-art in the field of non- volatile memories. It is an important opportunity for the NVM technical community to document their progress, reporting on recent achievements and future challenges.
Introduction to the Special Issue on Nonvolatile Memory Reliability, IEEE Transactions on Device and Materials Reliability / P., Cappelletti; Pavan, Paolo. - STAMPA. - (2004), pp. 299-300.