In this work, the magnetic properties of the Fe/NiO (100) interface at room temperature is investigated using non-linear magnetoopticalKerr effect. Nickel oxide is a promising material for technological applications due to its Ne´el temperature (525 K) occurring wellabove the room temperature. Non-linear Kerr rotation measurements have demonstrated to be an effective way to investigate a ferromagnetic/antiferromagnetic interface.The measurements here reported demonstrate that the magnetic properties of the studied interface strongly depend on the Fe layerthickness. In fact, a clear hysteresis loop is observed only for a thickness higher than 5 ML, whereas for the 2 ML sample the hysteresisloop completely disappears. These results are in agreement with previous structural characterizations of the interface. 2007 Elsevier B.V. All rights reserved.
Ferromagnetic-antiferromagnetic Fe/NiO (1 0 0) interface studied by non-linear Kerr effect / S., Colonna; F. Ronci, A. Cricenti; P., Luches; Valeri, Sergio; J., Qi; Y., Xu; J. K., Miller; N., Tolk. - In: SURFACE SCIENCE. - ISSN 0039-6028. - STAMPA. - 601:18(2007), pp. 4362-4365. [10.1016/j.susc.2007.06.011]
Ferromagnetic-antiferromagnetic Fe/NiO (1 0 0) interface studied by non-linear Kerr effect
VALERI, Sergio;
2007
Abstract
In this work, the magnetic properties of the Fe/NiO (100) interface at room temperature is investigated using non-linear magnetoopticalKerr effect. Nickel oxide is a promising material for technological applications due to its Ne´el temperature (525 K) occurring wellabove the room temperature. Non-linear Kerr rotation measurements have demonstrated to be an effective way to investigate a ferromagnetic/antiferromagnetic interface.The measurements here reported demonstrate that the magnetic properties of the studied interface strongly depend on the Fe layerthickness. In fact, a clear hysteresis loop is observed only for a thickness higher than 5 ML, whereas for the 2 ML sample the hysteresisloop completely disappears. These results are in agreement with previous structural characterizations of the interface. 2007 Elsevier B.V. All rights reserved.
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