Flash memories are the leader among nonvolatile memory technologies. Ionizing radiation impact their reliability both on the control circuitry and on the memory array itself. In particular, in FGs hit by ions the tracks of defects generated by ions in the tunnel oxide may result in a radiation induced leakage current (RILC), which can leads to retention problems in hit FGs. We are demonstrating and modeling this phenomenon in a state-of-the-art Floating Gate memory technology. We are also showing that RILC has a peculiar erratic behavior

Single event leakage current in Flash memory / G., Cellere; Larcher, Luca; A., Paccagnella; A., Visconti; M., Bonanomi. - STAMPA. - 1:(2006), pp. 1-4. ((Intervento presentato al convegno Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on tenutosi a Padova (Italy) nel 24-26, May, 2006.

Single event leakage current in Flash memory

LARCHER, Luca;
2006

Abstract

Flash memories are the leader among nonvolatile memory technologies. Ionizing radiation impact their reliability both on the control circuitry and on the memory array itself. In particular, in FGs hit by ions the tracks of defects generated by ions in the tunnel oxide may result in a radiation induced leakage current (RILC), which can leads to retention problems in hit FGs. We are demonstrating and modeling this phenomenon in a state-of-the-art Floating Gate memory technology. We are also showing that RILC has a peculiar erratic behavior
Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on
Padova (Italy)
24-26, May, 2006
1
1
4
G., Cellere; Larcher, Luca; A., Paccagnella; A., Visconti; M., Bonanomi
Single event leakage current in Flash memory / G., Cellere; Larcher, Luca; A., Paccagnella; A., Visconti; M., Bonanomi. - STAMPA. - 1:(2006), pp. 1-4. ((Intervento presentato al convegno Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on tenutosi a Padova (Italy) nel 24-26, May, 2006.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/604974
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