An experimental investigation has been carried out to study variations of microstructure, composition., and electrical properties (sheet resistance and its temp. coefficient) occurring in thick-film (cermet) resistors during the annealing process which transforms the initial ink into a resistive layer. Resistors based on Bi2Ru2O7 and a lead silica glass have been studied. Analyses have been performed on the inks using thermogravimetric measurements, and on annealed (fired) layers by means of x-ray diffraction, atomic absorption, electron microscopy, microprobe analysis, and other complementary techniques. The results point out the role of exchange reactions and redox reactions inside the resistor body and emphasize the complexity of the phenomena which concur to define the final elecrical properties of these resistive systems. Interrelations between microstructure, composition , and elecrical properties have been found and tentative explanations proposed.
Evolution of ruthenate-based thick-film cermet resistors / Morten, Bruno; Masoero, A.; Prudenziati, Maria; Manfredini, Tiziano. - In: JOURNAL OF PHYSICS D. APPLIED PHYSICS. - ISSN 0022-3727. - STAMPA. - 27:(1994), pp. 2227-2235.
Evolution of ruthenate-based thick-film cermet resistors
MORTEN, Bruno;PRUDENZIATI, Maria;MANFREDINI, Tiziano
1994
Abstract
An experimental investigation has been carried out to study variations of microstructure, composition., and electrical properties (sheet resistance and its temp. coefficient) occurring in thick-film (cermet) resistors during the annealing process which transforms the initial ink into a resistive layer. Resistors based on Bi2Ru2O7 and a lead silica glass have been studied. Analyses have been performed on the inks using thermogravimetric measurements, and on annealed (fired) layers by means of x-ray diffraction, atomic absorption, electron microscopy, microprobe analysis, and other complementary techniques. The results point out the role of exchange reactions and redox reactions inside the resistor body and emphasize the complexity of the phenomena which concur to define the final elecrical properties of these resistive systems. Interrelations between microstructure, composition , and elecrical properties have been found and tentative explanations proposed.
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris
