Measurements are presented of the Brillouin cross-section for a thin aluminium film on a silicon substrate measured using a tandem multipass interferometer. The measured spectra are compared with the cross-section computed by assuming that the light is inelasically scattered from surface corrugation due to the thermally excited acoustic phonons. By varying the thicness of the aluminium film we observe different spectral features such as the modified Rayleigh mode, the Sezawa modes and tho continuum os states of the sbstrate. The limiting case of a thick coating is also discussed.
Surface and Interface Acoustic Phonons in Al-Coated Silicon / J. R., Sandercock; F., Nizzoli; Bortolani, Virginio; Santoro, Giorgio; A., Marvin. - STAMPA. - 2:(1981), pp. 419-425. (Intervento presentato al convegno Recent Developements in Condensed Matter Physics tenutosi a Anversa nel September 1981).
Surface and Interface Acoustic Phonons in Al-Coated Silicon
BORTOLANI, Virginio;SANTORO, Giorgio;
1981
Abstract
Measurements are presented of the Brillouin cross-section for a thin aluminium film on a silicon substrate measured using a tandem multipass interferometer. The measured spectra are compared with the cross-section computed by assuming that the light is inelasically scattered from surface corrugation due to the thermally excited acoustic phonons. By varying the thicness of the aluminium film we observe different spectral features such as the modified Rayleigh mode, the Sezawa modes and tho continuum os states of the sbstrate. The limiting case of a thick coating is also discussed.
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