We report thickness dependence of magnetic linear dichroism (MLD) of in situ grown NiO(001) films on Ag(001) substrate at the Ni L-2 absorption edge. Antiferromagnetic domains at the surface of NiO(001) films are found to be preferentially aligned in-plane. For films thinner than a critical thickness t(c) (20-40ML), we observe a softening of the in-plane magnetic domain alignments with increasing film thickness, arising from the strain-relaxation effects. Films thicker than t(c) exhibits a residual in-plane anisotropy, possibly related to the finite-thickness effects. (c) 2006 Elsevier B.V. All rights reserved.
Magnetic linear dichroism studies of in situ grown NiO thin films / Krishnakumar, Sr; Liberati, Marco; Grazioli, C; Veronese, M; Turchini, S; Luches, P; Valeri, Sergio; Carbone, C.. - In: JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS. - ISSN 0304-8853. - STAMPA. - 310:1(2007), pp. 8-12. [10.1016/j.jmmm.2006.07.020]
Magnetic linear dichroism studies of in situ grown NiO thin films
LIBERATI, Marco;VALERI, Sergio;
2007
Abstract
We report thickness dependence of magnetic linear dichroism (MLD) of in situ grown NiO(001) films on Ag(001) substrate at the Ni L-2 absorption edge. Antiferromagnetic domains at the surface of NiO(001) films are found to be preferentially aligned in-plane. For films thinner than a critical thickness t(c) (20-40ML), we observe a softening of the in-plane magnetic domain alignments with increasing film thickness, arising from the strain-relaxation effects. Films thicker than t(c) exhibits a residual in-plane anisotropy, possibly related to the finite-thickness effects. (c) 2006 Elsevier B.V. All rights reserved.
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