Vanadium dioxide is of broad interest as a spin-12 electron system that realizes a metal-insulator transition near room temperature, due to a combination of strongly correlated and itinerant electron physics. Here, resonant inelastic x-ray scattering is used to measure the excitation spectrum of charge and spin degrees of freedom at the vanadium L edge under different polarization and temperature conditions, revealing excitations that differ greatly from those seen in optical measurements. These spectra encode the evolution of short-range energetics across the metal-insulator transition, including the low-temperature appearance of a strong candidate for the singlet-triplet excitation of a vanadium dimer.

Measurement of collective excitations in VO2 by resonant inelastic x-ray scattering / He, H., Gray, A.X., Granitzka, P., Jeong, J.W., Aetukuri, N.P., Kukreja, R., Miao, L., Breitweiser, S.A., Wu, J., Huang, Y.B., Olalde-Velasco, P., Pelliciari, J., Schlotter, W.F., Arenholz, E., Schmitt, T., Samant, M.G., Parkin, S.S.P., Dürr, H.A., Wray, L.A.. - In: PHYSICAL REVIEW. B. - ISSN 2469-9950. - 94:16(2016), pp. 1-6. [10.1103/physrevb.94.161119]

Measurement of collective excitations in VO2 by resonant inelastic x-ray scattering

Pelliciari, J.;
2016

Abstract

Vanadium dioxide is of broad interest as a spin-12 electron system that realizes a metal-insulator transition near room temperature, due to a combination of strongly correlated and itinerant electron physics. Here, resonant inelastic x-ray scattering is used to measure the excitation spectrum of charge and spin degrees of freedom at the vanadium L edge under different polarization and temperature conditions, revealing excitations that differ greatly from those seen in optical measurements. These spectra encode the evolution of short-range energetics across the metal-insulator transition, including the low-temperature appearance of a strong candidate for the singlet-triplet excitation of a vanadium dimer.
2016
94
16
1
6
Measurement of collective excitations in VO2 by resonant inelastic x-ray scattering / He, H., Gray, A.X., Granitzka, P., Jeong, J.W., Aetukuri, N.P., Kukreja, R., Miao, L., Breitweiser, S.A., Wu, J., Huang, Y.B., Olalde-Velasco, P., Pelliciari, J., Schlotter, W.F., Arenholz, E., Schmitt, T., Samant, M.G., Parkin, S.S.P., Dürr, H.A., Wray, L.A.. - In: PHYSICAL REVIEW. B. - ISSN 2469-9950. - 94:16(2016), pp. 1-6. [10.1103/physrevb.94.161119]
He, Haowei; Gray, A. X.; Granitzka, P.; Jeong, J. W.; Aetukuri, N. P.; Kukreja, R.; Miao, Lin; Breitweiser, S. Alexander; Wu, Jinpeng; Huang, Y. B.; O...espandi
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1410594
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