Hot Carrier Injection (HCI) is investigated from the experimental and modelling perspectives. Extensive characterization of HCI is performed on ash devices to overcome the difculties arising from direct gate injection measurements. Furthermore, a semi-analytical approach has been developped, capable of modelling both ash cell’s electrostatics during transient operation and gate current under HCI by a non-local model valid for long and short channel devices.

Characterization and modelling of gate current injection in embedded non-volatile flash memory / Zaka, A; Garetto, D; Rideau, D; Palestri, Pierpaolo; Manceau, J. P.; Dornel, E; Rafhay, Q; Clerc, R; Leblebici, Y; Tavernier, C; Jaouen, H.. - (2011), pp. 130-135. (Intervento presentato al convegno 2011 24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011 tenutosi a Amsterdam, nld nel 2011) [10.1109/ICMTS.2011.5976874].

Characterization and modelling of gate current injection in embedded non-volatile flash memory

PALESTRI, Pierpaolo;
2011

Abstract

Hot Carrier Injection (HCI) is investigated from the experimental and modelling perspectives. Extensive characterization of HCI is performed on ash devices to overcome the difculties arising from direct gate injection measurements. Furthermore, a semi-analytical approach has been developped, capable of modelling both ash cell’s electrostatics during transient operation and gate current under HCI by a non-local model valid for long and short channel devices.
2011
2011 24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011
Amsterdam, nld
2011
130
135
Zaka, A; Garetto, D; Rideau, D; Palestri, Pierpaolo; Manceau, J. P.; Dornel, E; Rafhay, Q; Clerc, R; Leblebici, Y; Tavernier, C; Jaouen, H.
Characterization and modelling of gate current injection in embedded non-volatile flash memory / Zaka, A; Garetto, D; Rideau, D; Palestri, Pierpaolo; Manceau, J. P.; Dornel, E; Rafhay, Q; Clerc, R; Leblebici, Y; Tavernier, C; Jaouen, H.. - (2011), pp. 130-135. (Intervento presentato al convegno 2011 24th IEEE International Conference on Microelectronic Test Structures, ICMTS 2011 tenutosi a Amsterdam, nld nel 2011) [10.1109/ICMTS.2011.5976874].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1328061
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