We discuss a monitoring system aiming to select, among a set of integrated entropy sources affected by process variability, the source guarantying the highest worst-case entropy. The approach is particularly suitable when considering True Random Number Generators based on Digital Nonlinear Oscillators, since multiple instances of the entropy sources can be implemented at a reduced hardware cost. In general, the approach can be applied for TRNGs based on parametric systems, thus offering entropy tuning capabilities. The original theoretical results have been validated with experiments.

A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators / Addabbo, T.; Fort, A.; Mugnaini, M.; Moretti, R.; Vignoli, V.; Papini, D.. - 2022-:(2022), pp. 1670-1674. (Intervento presentato al convegno 2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022 tenutosi a usa nel 2022) [10.1109/ISCAS48785.2022.9937869].

A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators

Papini D.
2022

Abstract

We discuss a monitoring system aiming to select, among a set of integrated entropy sources affected by process variability, the source guarantying the highest worst-case entropy. The approach is particularly suitable when considering True Random Number Generators based on Digital Nonlinear Oscillators, since multiple instances of the entropy sources can be implemented at a reduced hardware cost. In general, the approach can be applied for TRNGs based on parametric systems, thus offering entropy tuning capabilities. The original theoretical results have been validated with experiments.
2022
2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022
usa
2022
2022-
1670
1674
Addabbo, T.; Fort, A.; Mugnaini, M.; Moretti, R.; Vignoli, V.; Papini, D.
A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators / Addabbo, T.; Fort, A.; Mugnaini, M.; Moretti, R.; Vignoli, V.; Papini, D.. - 2022-:(2022), pp. 1670-1674. (Intervento presentato al convegno 2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022 tenutosi a usa nel 2022) [10.1109/ISCAS48785.2022.9937869].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1315899
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