This paper presents the optimization of electronic circuitry for operation in the harsh electro magnetic (EM) environment during a magnetic resonance imaging (MRI) scan. As demonstrator, a device small enough to be worn during the scan is optimized. Based on finite element method (FEM) simulations, the induced current densities due to magnetic field changes of 200 T s(-1) were reduced from 1 x 10(10) A m(-2) by one order of magnitude, predicting error-free operation of the 1.8 V logic employed. The simulations were validated using a bit error rate test, which showed no bit errors during a MRI scan sequence. Therefore, neither the logic, nor the utilized 800 Mbit s(-1) low voltage differential swing (LVDS) data link of the optimized wearable device were significantly influenced by the EM interference. Next, the influence of ferro-magnetic components on the static magnetic field and consequently the image quality was simulated showing a MRI image loss with approximately 2 cm radius around a commercial integrated circuit of 1 x 1 cm(2). This was successively validated by a conventional MRI scan.
Design and simulation of a 800 Mbit/s data link for magnetic resonance imaging wearables / Vogt, C; Buthe, L; Petti, L; Cantarella, G; Munzenrieder, N; Daus, A; Troster, G. - (2015), pp. 1323-1326. ((Intervento presentato al convegno 2015 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) tenutosi a Milan nel 25.8.2015 - 29.8.2015 [10.1109/EMBC.2015.7318612].