The Numerov Process (NP) provides the solution of some classes of ODEs with an accuracy much superior to that of the standard finite-difference or box-integration methods. The original formulation of NP requires a uniform grid, which is a drawback for applications to, e.g., the semiconductor-device equations. Purpose of this work is showing how a method for extending NP to a non-uniform grid is applied to the solution of the drift-diffusion model. The method keeps the fifth-order accuracy of the original NP. In the multi-dimensional case, the variable transformation illustrated in the paper is found beneficial also when standard solution schemes are used; in fact, it makes the current-density vector well defined within each grid element.

The Semiconductor Model Solved by the Numerov Process over a Non-Uniform Grid / Brunetti, R.; Rudan, M.. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021 tenutosi a Caen, France nel Sept. 1-3, 2021) [10.1109/EuroSOI-ULIS53016.2021.9560174].

The Semiconductor Model Solved by the Numerov Process over a Non-Uniform Grid

Brunetti R.;
2021

Abstract

The Numerov Process (NP) provides the solution of some classes of ODEs with an accuracy much superior to that of the standard finite-difference or box-integration methods. The original formulation of NP requires a uniform grid, which is a drawback for applications to, e.g., the semiconductor-device equations. Purpose of this work is showing how a method for extending NP to a non-uniform grid is applied to the solution of the drift-diffusion model. The method keeps the fifth-order accuracy of the original NP. In the multi-dimensional case, the variable transformation illustrated in the paper is found beneficial also when standard solution schemes are used; in fact, it makes the current-density vector well defined within each grid element.
2021
2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021
Caen, France
Sept. 1-3, 2021
1
4
Brunetti, R.; Rudan, M.
The Semiconductor Model Solved by the Numerov Process over a Non-Uniform Grid / Brunetti, R.; Rudan, M.. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon, EuroSOI-ULIS 2021 tenutosi a Caen, France nel Sept. 1-3, 2021) [10.1109/EuroSOI-ULIS53016.2021.9560174].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1262917
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