Nanowires and nanotubes can be examined in the transmission electron microscope under an applied bias. Here we introduce a model-independent method, which allows the charge distribution along a nanowire or nanotube to be measured directly from the Laplacian of an electron holographic phase image. We present results from a biased bundle of carbon nanotubes, in which we show that the charge density increases linearly with distance from its base, reaching a value of similar to 0.8 electrons/nm near its tip. (C) 2011 American Institute of Physics. [doi:10.1063/1.3598468]
Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography / Beleggia, M; Kasama, T; Dunin-Borkowski, Re; Hofmann, S; Pozzi, G. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 98:24(2011). [10.1063/1.3598468]
Direct measurement of the charge distribution along a biased carbon nanotube bundle using electron holography
Beleggia M;
2011
Abstract
Nanowires and nanotubes can be examined in the transmission electron microscope under an applied bias. Here we introduce a model-independent method, which allows the charge distribution along a nanowire or nanotube to be measured directly from the Laplacian of an electron holographic phase image. We present results from a biased bundle of carbon nanotubes, in which we show that the charge density increases linearly with distance from its base, reaching a value of similar to 0.8 electrons/nm near its tip. (C) 2011 American Institute of Physics. [doi:10.1063/1.3598468]
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