The magnetic configuration of a submicrometer Ni88Fe12 permalloy island has been quantitatively mapped by off-axis electron holography. The two main contributions to the electron-optical phase shift, namely the phase shifts induced by the electrostatic and magnetic potentials, including fringing fields, were separated by inverting the specimen of 180degrees with respect to the electron beam and directly measuring the mean inner potential. A quantitative map of the projected magnetic induction in the sample was thereby retrieved and compared to results of micromagnetic and electromagnetic calculations, providing the minimum-energy configuration and the phase shift, respectively. (C) 2003 American Institute of Physics.

Quantitative study of magnetic field distribution by electron holography and micromagnetic simulations / Beleggia, M; Schofield, Ma; Zhu, Y; Malac, M; Liu, Z; Freeman, M. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 83:7(2003), pp. 1435-1437. [10.1063/1.1603355]

Quantitative study of magnetic field distribution by electron holography and micromagnetic simulations

Beleggia M;
2003

Abstract

The magnetic configuration of a submicrometer Ni88Fe12 permalloy island has been quantitatively mapped by off-axis electron holography. The two main contributions to the electron-optical phase shift, namely the phase shifts induced by the electrostatic and magnetic potentials, including fringing fields, were separated by inverting the specimen of 180degrees with respect to the electron beam and directly measuring the mean inner potential. A quantitative map of the projected magnetic induction in the sample was thereby retrieved and compared to results of micromagnetic and electromagnetic calculations, providing the minimum-energy configuration and the phase shift, respectively. (C) 2003 American Institute of Physics.
2003
83
7
1435
1437
Quantitative study of magnetic field distribution by electron holography and micromagnetic simulations / Beleggia, M; Schofield, Ma; Zhu, Y; Malac, M; Liu, Z; Freeman, M. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 83:7(2003), pp. 1435-1437. [10.1063/1.1603355]
Beleggia, M; Schofield, Ma; Zhu, Y; Malac, M; Liu, Z; Freeman, M
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1255496
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