The aim of this paper is to present and discuss the recent results obtained in the investigation of reverse-biased p-n junctions by means of the out-of-focus method. It will be shown how the interpretation of the experimental images is not in agreement with the expectations based on the bulk p-n junction theory. The possible causes of this discrepancy will be discussed: among them a significant reason could be the finite specimen thickness with the associated surface states, which influences the width and shape of the depletion layer in the thinned specimen. (C) 2000 Elsevier Science Ltd. All rights reserved.
Electron microscopy of reverse biased p-n junctions / Beleggia, M; Cristofori, D; Merli, Pg; Pozzi, G. - In: MICRON. - ISSN 0968-4328. - 31:3(2000), pp. 231-236. [10.1016/S0968-4328(99)00088-8]
Electron microscopy of reverse biased p-n junctions
Beleggia M;
2000
Abstract
The aim of this paper is to present and discuss the recent results obtained in the investigation of reverse-biased p-n junctions by means of the out-of-focus method. It will be shown how the interpretation of the experimental images is not in agreement with the expectations based on the bulk p-n junction theory. The possible causes of this discrepancy will be discussed: among them a significant reason could be the finite specimen thickness with the associated surface states, which influences the width and shape of the depletion layer in the thinned specimen. (C) 2000 Elsevier Science Ltd. All rights reserved.
Pubblicazioni consigliate
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris
