Profile magnetic configuration of a quantized flux line and flux-line lattice penetrating a type-II superconductor thin foil, niobium, was observed by electron holography and Lorentz microscopy using a 300 kV field-emission electron microscope. Each single flux line was distributed periodically as lattice structure in the mixed state just below its critical temperature of 8.5 K, while at low temperature of 5 K the flux lines were weakly bound as bundles. in order to observe the flux-line distribution over a wide area, discrete Fourier transform reconstruction in the holography was extended for a rectangular area without loss of information and data precision.

Profile structure of magnetic flux lines in type-II superconductor from a rectangular electron hologram / Harada, K; Beleggia, M; Endo, J; Kasai, H; Togawa, Y; Matsuda, T; Tonomura, A. - In: JOURNAL OF ELECTRON MICROSCOPY. - ISSN 0022-0744. - 52:4(2003), pp. 369-373. [10.1093/jmicro/52.4.369]

Profile structure of magnetic flux lines in type-II superconductor from a rectangular electron hologram

Beleggia M;
2003

Abstract

Profile magnetic configuration of a quantized flux line and flux-line lattice penetrating a type-II superconductor thin foil, niobium, was observed by electron holography and Lorentz microscopy using a 300 kV field-emission electron microscope. Each single flux line was distributed periodically as lattice structure in the mixed state just below its critical temperature of 8.5 K, while at low temperature of 5 K the flux lines were weakly bound as bundles. in order to observe the flux-line distribution over a wide area, discrete Fourier transform reconstruction in the holography was extended for a rectangular area without loss of information and data precision.
2003
52
4
369
373
Profile structure of magnetic flux lines in type-II superconductor from a rectangular electron hologram / Harada, K; Beleggia, M; Endo, J; Kasai, H; Togawa, Y; Matsuda, T; Tonomura, A. - In: JOURNAL OF ELECTRON MICROSCOPY. - ISSN 0022-0744. - 52:4(2003), pp. 369-373. [10.1093/jmicro/52.4.369]
Harada, K; Beleggia, M; Endo, J; Kasai, H; Togawa, Y; Matsuda, T; Tonomura, A
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1255469
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