The paper focuses on the fault detection of a five-phase Permanent-Magnet (PM) machine. This machine has been designed for fault tolerant applications, and it is characterised by a mutual inductance equal to zero and a high self inductance, with the purpose to limit the short circuit current. The effects of a limited number of short-circuited turns were investigated by theoretical and Finite Element (FE) analysis, and then a procedure for fault detection has been proposed, focusing on the severity of the fault (i.e. the number of shortcircuited turns and the related current). © 2008 IEEE.

Fault detection of a five-phase Permanent-Magnet machine / Bianchini, C.; Fomasiero, E.; Matzen, T. N.; Bianchi, N.; Bellini, A.. - (2008), pp. 1200-1205. (Intervento presentato al convegno 34th Annual Conference of the IEEE Industrial Electronics Society, IECON 2008 tenutosi a Orlando, FL, usa nel 2008) [10.1109/IECON.2008.4758125].

Fault detection of a five-phase Permanent-Magnet machine

Bianchini C.;
2008

Abstract

The paper focuses on the fault detection of a five-phase Permanent-Magnet (PM) machine. This machine has been designed for fault tolerant applications, and it is characterised by a mutual inductance equal to zero and a high self inductance, with the purpose to limit the short circuit current. The effects of a limited number of short-circuited turns were investigated by theoretical and Finite Element (FE) analysis, and then a procedure for fault detection has been proposed, focusing on the severity of the fault (i.e. the number of shortcircuited turns and the related current). © 2008 IEEE.
2008
34th Annual Conference of the IEEE Industrial Electronics Society, IECON 2008
Orlando, FL, usa
2008
1200
1205
Bianchini, C.; Fomasiero, E.; Matzen, T. N.; Bianchi, N.; Bellini, A.
Fault detection of a five-phase Permanent-Magnet machine / Bianchini, C.; Fomasiero, E.; Matzen, T. N.; Bianchi, N.; Bellini, A.. - (2008), pp. 1200-1205. (Intervento presentato al convegno 34th Annual Conference of the IEEE Industrial Electronics Society, IECON 2008 tenutosi a Orlando, FL, usa nel 2008) [10.1109/IECON.2008.4758125].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1253100
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