An analytical model for the electric field associated with a periodic array of alternating p- and n-doped stripes lying in a half-plane, tilted with respect to the specimen edges and thus better representing the actual experimental set-up is presented. With respect to a previous treatment, relative to the case of stripes perpendicular to the edge, a more physical derivation is outlined, and the calculated phase shift is used to interpret the main features of holography and Lorentz microscopy images, allowing a quantitative assessment of the influence of the specimen edge on them.
A model for the interpretation of holographic and Lorentz images of tilted reverse-biased p-n junctions in a finite specimen / Beleggia, M.; Capelli, R.; Pozzi, G.. - In: PHILOSOPHICAL MAGAZINE. B. PHYSICS OF CONDENSED MATTER. STATISTICAL MECHANICS, ELECTRONIC, OPTICAL AND MAGNETIC PROPERTIES. - ISSN 1364-2812. - 80:5(2000), pp. 1071-1082. (Intervento presentato al convegno International Workshop on Semiconducting and Superconducting Materials tenutosi a Torino, ita nel 1999).