In partictular, the thermal flux crowding effect and the conditions under which a temperature gradient peak builds up are reported. The influeilce of the bending radius of the structure is also taken into account. © 1996 Editions Frontieres.This work reports on the results obtained from numerical simulations of cturrent density, temperature and temperature gradient distributions along test strtuctures designed for the evaluation of electromigration.

Electrical and thermal local effects simulation for electromigration / Borgarino, M.; Castagnini, A.; De Munari, I.; Fantini, F.. - (1996), pp. 921-924. (Intervento presentato al convegno 26th European Solid State Device Research Conference, ESSDERC 1996 tenutosi a Congress Centre, ita nel 1996).

Electrical and thermal local effects simulation for electromigration

Borgarino M.;Castagnini A.;
1996

Abstract

In partictular, the thermal flux crowding effect and the conditions under which a temperature gradient peak builds up are reported. The influeilce of the bending radius of the structure is also taken into account. © 1996 Editions Frontieres.This work reports on the results obtained from numerical simulations of cturrent density, temperature and temperature gradient distributions along test strtuctures designed for the evaluation of electromigration.
1996
26th European Solid State Device Research Conference, ESSDERC 1996
Congress Centre, ita
1996
921
924
Borgarino, M.; Castagnini, A.; De Munari, I.; Fantini, F.
Electrical and thermal local effects simulation for electromigration / Borgarino, M.; Castagnini, A.; De Munari, I.; Fantini, F.. - (1996), pp. 921-924. (Intervento presentato al convegno 26th European Solid State Device Research Conference, ESSDERC 1996 tenutosi a Congress Centre, ita nel 1996).
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1248793
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