Polycrystalline La0.7Sr0.3MnO3 manganite thin films were grown on silicon substrates covered by SiOx amorphous native oxide. Unusual splitting of the manganite layer was found: on the top of an intermediate layer characterised by lower crystalline order, a magnetic robust layer is formed. Curie temperatures of about 325 K were achieved for 70 nm thick films. A strong room temperature XMCD signal was detected indicating high spin polarisation near the surface. © 2005 Elsevier Ltd. All rights reserved.
Structural and magnetic properties of thin manganite films grown on silicon substrates / Bergenti, I.; Dediu, V.; Arisi, E.; Cavallini, M.; Moulin, J. F.; Biscarini, F.; De Jong, M.; Dennis, C.; Gregg, J.. - In: PROGRESS IN SOLID STATE CHEMISTRY. - ISSN 0079-6786. - 33:2-4(2005), pp. 293-298. [10.1016/j.progsolidstchem.2005.11.004]
Structural and magnetic properties of thin manganite films grown on silicon substrates
Biscarini F.;
2005
Abstract
Polycrystalline La0.7Sr0.3MnO3 manganite thin films were grown on silicon substrates covered by SiOx amorphous native oxide. Unusual splitting of the manganite layer was found: on the top of an intermediate layer characterised by lower crystalline order, a magnetic robust layer is formed. Curie temperatures of about 325 K were achieved for 70 nm thick films. A strong room temperature XMCD signal was detected indicating high spin polarisation near the surface. © 2005 Elsevier Ltd. All rights reserved.
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