La1-xAgxMnO3+δ (x = 0; 0.2) perovskites have been prepared using a microwaves process (MWhyd) by comparing the heating time and reaction temperature with the same factor under conventional thermal process (CHhyd). Experiments have been conducted using hydrothermal method at medium pressure (T = 200°C, P = 2.06 MPa.) followed by a conventional treatment of the precursor at 700°C (10h). While MWhyd and CHhyd powders exhibited the same XRD patterns indexed as pure perovskite structure, their physico-chemical properties were found to be strongly influenced by the preparation method. La1-xAgxMnO3+δ perovskites were characterised using x-ray diffraction (XRD), BET sorption, temperature programmed reduction-mass spectrometry (TPR-MS), x-ray photoelectron spectroscopy (XPS), and dielectric measurements in the frequency range 200 MHz-3GHz.
Dielectric characterization of La1-xAgxMnO3+δ (x = 0; 0.2) perovskites in the frequency range 200MHz-3GHz / Kaddouri, A.; Rizzuti, A.; Veronesi, P.; Leonelli, C.. - (2007), pp. 353-356. (Intervento presentato al convegno 11th International Conference on Microwave and High Frequency Heating, AMPERE 2007 tenutosi a rou nel 2007).
Dielectric characterization of La1-xAgxMnO3+δ (x = 0; 0.2) perovskites in the frequency range 200MHz-3GHz
Rizzuti A.;Veronesi P.;Leonelli C.
2007
Abstract
La1-xAgxMnO3+δ (x = 0; 0.2) perovskites have been prepared using a microwaves process (MWhyd) by comparing the heating time and reaction temperature with the same factor under conventional thermal process (CHhyd). Experiments have been conducted using hydrothermal method at medium pressure (T = 200°C, P = 2.06 MPa.) followed by a conventional treatment of the precursor at 700°C (10h). While MWhyd and CHhyd powders exhibited the same XRD patterns indexed as pure perovskite structure, their physico-chemical properties were found to be strongly influenced by the preparation method. La1-xAgxMnO3+δ perovskites were characterised using x-ray diffraction (XRD), BET sorption, temperature programmed reduction-mass spectrometry (TPR-MS), x-ray photoelectron spectroscopy (XPS), and dielectric measurements in the frequency range 200 MHz-3GHz.
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