The growing demand for high-performance power converters calls for the adoption of new strategies, not only in architectures, but also in electronic technologies. To take full advantage of wide-bandgap semiconductor (SiC, GaN) power devices, and to exploit their amazing capabilities, dedicated drivers need to be developed. This paper presents a control unit for advanced gate drivers, based on a finite-state machine (FSM), and discusses design criteria; the proposed design is verified by simulation in Matlab-Simulink. The presented automaton not only «follows» the power switch during its state transitions, but features also automatic dead-time insertion when the switch is operated in bridge configurations, and is able to provide important diagnostic and self-test information.
Design of a control unit for advanced gate drivers featuring adaptive dead-time and diagnostics / Soldati, Alessandro; Barater, Davide; Brugnano, Francesco; Concari, Carlo. - (2015), pp. 2485-2490. ((Intervento presentato al convegno 41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015 tenutosi a Pacifico Yokohama, jpn nel 2015 [10.1109/IECON.2015.7392476].
Design of a control unit for advanced gate drivers featuring adaptive dead-time and diagnostics
Barater, Davide;
2015
Abstract
The growing demand for high-performance power converters calls for the adoption of new strategies, not only in architectures, but also in electronic technologies. To take full advantage of wide-bandgap semiconductor (SiC, GaN) power devices, and to exploit their amazing capabilities, dedicated drivers need to be developed. This paper presents a control unit for advanced gate drivers, based on a finite-state machine (FSM), and discusses design criteria; the proposed design is verified by simulation in Matlab-Simulink. The presented automaton not only «follows» the power switch during its state transitions, but features also automatic dead-time insertion when the switch is operated in bridge configurations, and is able to provide important diagnostic and self-test information.
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