The growing demand for high-performance power converters calls for the adoption of new strategies, not only in architectures, but also in electronic technologies. To take full advantage of wide-bandgap semiconductor (SiC, GaN) power devices, and to exploit their amazing capabilities, dedicated drivers need to be developed. This paper presents a control unit for advanced gate drivers, based on a finite-state machine (FSM), and discusses design criteria; the proposed design is verified by simulation in Matlab-Simulink. The presented automaton not only «follows» the power switch during its state transitions, but features also automatic dead-time insertion when the switch is operated in bridge configurations, and is able to provide important diagnostic and self-test information.

Design of a control unit for advanced gate drivers featuring adaptive dead-time and diagnostics / Soldati, Alessandro; Barater, Davide; Brugnano, Francesco; Concari, Carlo. - (2015), pp. 2485-2490. ((Intervento presentato al convegno 41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015 tenutosi a Pacifico Yokohama, jpn nel 2015 [10.1109/IECON.2015.7392476].

Design of a control unit for advanced gate drivers featuring adaptive dead-time and diagnostics

Barater, Davide;
2015

Abstract

The growing demand for high-performance power converters calls for the adoption of new strategies, not only in architectures, but also in electronic technologies. To take full advantage of wide-bandgap semiconductor (SiC, GaN) power devices, and to exploit their amazing capabilities, dedicated drivers need to be developed. This paper presents a control unit for advanced gate drivers, based on a finite-state machine (FSM), and discusses design criteria; the proposed design is verified by simulation in Matlab-Simulink. The presented automaton not only «follows» the power switch during its state transitions, but features also automatic dead-time insertion when the switch is operated in bridge configurations, and is able to provide important diagnostic and self-test information.
41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015
Pacifico Yokohama, jpn
2015
2485
2490
Soldati, Alessandro; Barater, Davide; Brugnano, Francesco; Concari, Carlo
Design of a control unit for advanced gate drivers featuring adaptive dead-time and diagnostics / Soldati, Alessandro; Barater, Davide; Brugnano, Francesco; Concari, Carlo. - (2015), pp. 2485-2490. ((Intervento presentato al convegno 41st Annual Conference of the IEEE Industrial Electronics Society, IECON 2015 tenutosi a Pacifico Yokohama, jpn nel 2015 [10.1109/IECON.2015.7392476].
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

Licenza Creative Commons
I metadati presenti in IRIS UNIMORE sono rilasciati con licenza Creative Commons CC0 1.0 Universal, mentre i file delle pubblicazioni sono rilasciati con licenza Attribuzione 4.0 Internazionale (CC BY 4.0), salvo diversa indicazione.
In caso di violazione di copyright, contattare Supporto Iris

Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11380/1170937
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact