Active Thermal Control (ATC) consists in driving power switches in a less efficient way when low load conditions are present. The resulting wasted power is used to self-heat the device, reducing amplitude and occurrence of thermal cycles and hence improving the reliability. This paper presents a novel way to control losses, and hence temperature, of both positive- and negative-current devices in half-bridge topologies at various load conditions. The goal is achieved by means of a controlled shoot-through of the half-bridge leg.

Active thermal control by controlled shoot-through of power devices / Soldati, Alessandro; Concari, Carlo; Barater, Davide; Iannuzzo, Francesco; Blaabjerg, Frede. - 2017-:(2017), pp. 4363-4368. (Intervento presentato al convegno 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 tenutosi a China National Convention Center, chn nel 2017) [10.1109/IECON.2017.8216751].

Active thermal control by controlled shoot-through of power devices

Barater, Davide;
2017

Abstract

Active Thermal Control (ATC) consists in driving power switches in a less efficient way when low load conditions are present. The resulting wasted power is used to self-heat the device, reducing amplitude and occurrence of thermal cycles and hence improving the reliability. This paper presents a novel way to control losses, and hence temperature, of both positive- and negative-current devices in half-bridge topologies at various load conditions. The goal is achieved by means of a controlled shoot-through of the half-bridge leg.
2017
43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017
China National Convention Center, chn
2017
2017-
4363
4368
Soldati, Alessandro; Concari, Carlo; Barater, Davide; Iannuzzo, Francesco; Blaabjerg, Frede
Active thermal control by controlled shoot-through of power devices / Soldati, Alessandro; Concari, Carlo; Barater, Davide; Iannuzzo, Francesco; Blaabjerg, Frede. - 2017-:(2017), pp. 4363-4368. (Intervento presentato al convegno 43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017 tenutosi a China National Convention Center, chn nel 2017) [10.1109/IECON.2017.8216751].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11380/1170924
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